Charged particle detection using swept charge devices
Uma Unnikrishnan, M. Sudhakar, A. Tyagi, M. Bug, V. Radhakrishna and P. S. Athiray
University of Calicut and ISRO Satelite Centre, Bangalore
E-mail: umau1986@gmail.com

Abstract. Airless planetary bodies like the Moon allow us to remotely sense their surface elemental composition using the technique of X-Ray Fluorescence (XRF) spectroscopy. An array of twenty four Swept Charge Devices (SCDs) will form the Chandrayaan-2 Large Area Soft X-ray Spectrometer (CLASS) to be flown on Chandrayaan-2 for XRF studies of the lunar surface. The innovative SCD can provide better X-ray spectroscopic performance at higher operating temperatures compared to X-ray CCDs. However the fluorescent spectra produced by X-rays from the sun can also be contaminated by Particle Induced X-ray Emissions (PIXE). In order to estimate the PIXE contribution to the observed X-ray spectrum, it is required to have a simultaneous measurement of charged particle flux in the lunar orbit. Tests are being conducted in this regard to test the feasibility of using one of the SCDs of CLASS for charged particle detection. Experiments have been carried out where a scintillator of suitable thickness is placed over an SCD to convert it into a particle detector. Preliminary results of these experiments will be presented in this work.